Sundarrajan Subramanian
DFT and DV lead, Qualcomm India
Title: Test challenges for the connected world


Chips targeted for the mobile industry pose a unique challenge for test and productization. The mobile business environment drives steep volume ramps, with the shortest runway to phone launches using the latest manufacturing process/nodes to provide best in class user experiences. The highly competitive market demands the lowest test cost and highest quality . This talk will cover the test challenges and  trade offs required to successfully ramp products in this market and will also explore challenges when these products are extended to cover adjacent markets like Automotive.


Sundarrajan Subramanian is a Senior Director , Technology at Qualcomm Bangalore and is responsible for managing the Design-For-Test (DFT) and SoC Verification organizations. The test teams in India ( Bangalore, Noida and Hyderabad) are responsible to deliver end to end products spanning multiple technology nodes and varied markets across Mobile, IoT, Automotive etc. Sundar’s previous responsibilities at Qualcomm include leading the SoC development and productization for Qualcomm thin modems across multiple generations. Sundar has held positions previously at Teradyne (USA), Cisco Systems ( USA), Texas Instruments ( India) in the areas of Design-For-Test (DFT), Implementation, Post Si debug, Design Management . Sundar has been in the VLSI industry for close to 22 years and has a Master’s degree in Solid State Electronics from Arizona State University , USA.