Dr. Rohit Kapur, IEEE Fellow
Distinguished Engineer
Cadence Design Systems, USA
Title: IC Test – Where the Excitement Never Ends (Banquet Talk)


IC test has been a rapidly evolving area. The evolution of test methods over the years is presented with the focus on the issues of today. The presentation will cover a few interesting technologies from the past with the goal of discussing the key aspects of good solutions. Characteristics of technologies that are successful in the industry will be covered. Finally the presentation will talk about the current drivers of test technology – Automotive, AI and Time-to-Market.


Rohit Kapur is a Distinguished Engineer at Cadence in the area of Test Automation. Rohit is an IEEE Fellow and has a Ph.D. from the University of Texas at Austin specializing in IC Testing. Rohit has chaired the IEEE 1450.6 standard that defines the Core Test Language which is currently being used in the major EDA solutions. Rohit has served on the board of governors of Computer Society, he has chaired the standards activities for IEEE in the test area for over 10 years and currently serves on the board of IEEE Computer Magazine leading the publications in Computing Practices. Rohit is the author of a book and has over 100 publications and 40 patents in the area of IC test.