Dr. Ken Butler
DFT/Test/Reliability/Software Engineer and Data Scientist
Texas Instrument, Dallas, USA
Title: Managing Test Coverage and Quality across a Diverse Portfolio Using a Data-Centric Approach (Keynote Talk)

Abstract:

Electronics are ubiquitous in modern society. From mobile compute platforms to autonomous vehicles to Industry 4.0, we interact with technology constantly in our daily lives. An ever-more-sophisticated and increasingly larger user base demands higher and higher levels of product quality and reliability, which requires innovative test solutions. The challenge is even greater for companies fielding a large and diverse array of products, with development and manufacturing spread across multiple sites and time zones. In this talk, we will discuss this exciting environment and some ideas for employing data-centric methodologies to meet the challenge and succeed.

Bio:

Kenneth M. (Ken) Butler is a Test Systems Architect in the Central Analog Engineering Group at Texas Instruments in Dallas, Texas. He has been with TI for over 35 years and has worked in the areas of design for testability, product reliability, analog product and test engineering, design automation, and data analytics. Ken has a BS from Oklahoma State University and an MS and PhD from the University of Texas at Austin, all in electrical engineering. He is a Fellow of the IEEE, a Golden Core member of the IEEE Computer Society, and a Senior Member of the ACM.