The Asian Test Symposium (ATS) provides an open forum dedicated to the electronic test of devices, boards and systems—covering the complete test cycle from design verification, design-for- test, design-for- manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians and students working in India and abroad. At ATS 2019, the design, test, and yield challenges faced by the industry are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

The 28th IEEE Asian Test Symposium (ATS 2019) is going to be held at Kolkata, India during December 10-13, 2019 in collaboration with IIEST Shibpur, IIT Kharagpur, ISI Calcutta, Calcutta University and Jadavpur University.

The theme for the conference this year is “Testing in the Era of AI and Autonomous System“. This 4 day conference comprises: first day (10th December, 2019) of Tutorial followed by main conference during the last three days (December 11-13, 2019).

The organizing committee of ATS 2019 invites you all to Kolkata, the City of Joy.