The Asian Test Symposium (ATS) provides an open forum dedicated to the electronic test of devices, boards, and systems—covering the complete test cycle from design verification,design-for-test, design-for-manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
The 28th IEEE Asian Test Symposium (ATS 2019) is to be organized at Kolkata, India, during December 10-13, 2019 in collaboration with IIEST Shibpur, IIT Kharagpur, ISI Calcutta, Calcutta University and Jadavpur University.
The theme for the conference this year is “Testing in the Era of AI and Autonomous System.“ This four-day conference comprises first day (10th December 2019) of Tutorial, followed by the main conference during the last three days (December 11-13, 2019).
The organizing committee of ATS 2019 invites you all to Kolkata, the city of Joy.
Paper submission deadline :
June 14, 2019 June 28, 2019July 12, 2019
Notification of acceptance :
August 16, 2019 August 23, 2019 August 31, 2019
Camera-ready paper due :
September 13, 2019 September 20, 2019